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Width Measuring System - List of Manufacturers, Suppliers, Companies and Products

Width Measuring System Product List

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Laser Line Width Measurement System "A0020A"

Laser Line Width Measurement System "A0020A"

Easily and stably measures narrow linewidths down to a lower limit of 50 kHz.

The A0020A laser linewidth measurement system is a system that enables stable and highly reproducible linewidth measurements using a proven self-delay heterodyne method. It can easily and reliably measure narrow linewidths of laser light sources used in digital coherent optical communication, down to a lower limit of 40 kHz. 【Features】 ■ Easily and reliably measures narrow linewidths down to a lower limit of 40 kHz ■ Can be integrated with the A0010A RIN measurement system ■ Employs a self-delay heterodyne method in the interferometer *For more details, please download the PDF or feel free to contact us.

  • Optical Measuring Instruments

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Micro Line Width Measurement System 'LW-3200/MT-3200'

Micro Line Width Measurement System 'LW-3200/MT-3200'

Easy to attach to your microscope, system upgrade! Various edge detection specifications are possible.

The "LW-3200/MT-3200" is a system that can measure the linewidth of semiconductor wafers and liquid crystal color resist with a repeatability precision of 3σ = 10nm. Depending on the type of line, such as negative, positive, inside, or outside, various edge detection specifications can be set. Inclined lines can also be measured perpendicularly to the detected line. Additionally, it can be combined with easy operation and high-precision autofocus as an option. *Please note that there may be a certain period required for delivery. 【Features】 ■ Measurement with a repeatability precision of 3σ = 10nm ■ Various edge detection specifications available according to the type of line ■ Inclined lines can be measured perpendicularly to the detected line ■ Can be combined with easy operation and high-precision autofocus (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Micro Line Width Measurement System 'VP-5LW'

Micro Line Width Measurement System 'VP-5LW'

Easy operation and standard high-precision AF function! Measures small line widths with a repeatability of 3σ=10nm.

The "VP-5LW" is an all-in-one micro line width measurement device equipped with a Z-axis stage motor output driver, autofocus function, measurement software, and Windows OS. It measures the micro line widths of semiconductor wafers and liquid crystal color resists with a repeatability accuracy of 3σ=10nm (at 100x magnification). Depending on the type of line, various edge detection specifications can be set, and it is possible to measure vertically to the detected line even if the line is tilted. *Please note that there may be a certain period required before delivery. 【Features】 ■ Standard AF function ■ 3 million pixel monochrome camera ■ Proprietary AF image processing unit ■ Various edge detection specifications can be set according to the type of line *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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